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Memory test
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#	Item
321	Mem Cogn[removed]:1275–1289 DOI[removed]s13421[removed]The Cognitive Reflection Test as a predictor of performance on heuristics-and-biases tasks Maggie E. Toplak & Richard F. West & Keith E. Stanovich Add to Reading List Source URL: keithstanovich.com Language: English - Date: 2012-05-21 17:05:56 Science Intelligence quotient Intelligence G factor Psychology Problem solving Cognitive load Working memory Validity Educational psychology Education Mind
322	SPEAr1340 Dual-core Cortex A9 HMI embedded MPU Datasheet − production data Features ■ Add to Reading List Source URL: spear1340.com Language: English - Date: 2013-07-09 03:26:25 Computer memory Microcontrollers Embedded systems Electronics manufacturing Joint Test Action Group Static random-access memory Dynamic random-access memory PSoC Atmel AVR Computer hardware Electronics Electronic engineering
323	CoreSight Trace Memory Controller The new CoreSight Trace Memory Controller provides SoC designers with more design options for the trace infrastructure. TRACE32 already has support for the first designs which use the TM Add to Reading List Source URL: www.lauterbach.com Language: English - Date: 2012-02-16 07:49:34 Electronics manufacturing Joint Test Action Group Manufacturing ARM architecture Advanced Microcontroller Bus Architecture IEEE standards Computer architecture Electronics
324	Version 1, September[removed]CCS-L2X3 LEO II instruction set. Add to Reading List Source URL: www.ourcomputerheritage.org Language: English - Date: 2012-01-22 14:41:46 Electronic test equipment Computer hardware Laboratory equipment Oscilloscope LEO Magnetic-core memory A.C. Cossor Eastcote Technology Electronics Computer memory
325	Affordable Testing For High-Speed DDR1/DDR2 With optional adapters, RAMCHECK will test and identify 240-pin DDR2 modules, 184-pin DDR1, as well as older 168-pin SDRAM/EDO/FPM DIMMs. Fully expandable, RAMCHECK also has op Add to Reading List Source URL: www.innoventions.com Language: English - Date: 2006-12-29 16:11:30 DIMM Computer memory DDR2 SDRAM Synchronous dynamic random-access memory Dynamic random-access memory DDR SDRAM DDR3 SDRAM Computer hardware SDRAM Computing
326	An Ecomonical Alternative to Boundary Scan in Memory Devices Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-01-22 18:19:36 Manufacturing Boundary scan Design for testing Joint Test Action Group In-circuit test Automatic test pattern generation Integrated circuit design Input/output Reliability engineering Electronics manufacturing Electronic engineering Electronics
327	This Poster provides an overview of IEEE Std[removed]test mode entry and exit methods as well as examples for test logic implementations. IEEE Std 1581 drastically simplifies connectivity test for memory devices poten Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2011-09-27 22:35:01 Electronics manufacturing Embedded systems Digital electronics Logic gate Boundary scan XNOR gate Microcontroller Joint Test Action Group Electronic engineering Electronics Manufacturing
328	IEEE Std[removed]A Standardized Test Access Methodology for Memory Devices 2011 International Test Conference Heiko Ehrenberg Bob Russell Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2011-09-27 22:34:31 Electronics Technology Standards organizations Boundary scan Joint Test Action Group Institute of Electrical and Electronics Engineers Electronics manufacturing IEEE standards Manufacturing
329	Naming the color of a word: Is it responses or task sets that compete? Add to Reading List Source URL: www.tim-taylor.com Language: English - Date: 2013-12-10 16:45:29 Memory Neuropsychological tests Perception Cognitive tests Mental processes Task switching Stroop effect Priming Emotional Stroop test Mind Psychology Cognitive science
330	TEST YOUR MEMORY PLEASE WRITE YOUR FULL NAME ....... . ............. . ...................... . .... . TODA Y IS ........ ...... ... ...DAY Add to Reading List Source URL: www.neurologyspecialists.org Language: English - Date: 2013-08-25 06:59:47

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